M 400

Product Details

MarSurf M 400 – The Best of the “Mobiles”! Easy. Fast.
Innovative. With skidless tracing and automatic zero
setting.

MarSurf M 400 represents the consistant further development of
the surface measuring family from Mahr.

For use as a small measuring station as well as for use as a
mobile unit, the MarSurf M 400 fulfills the needs on the
shopfloor and in production and the measuring room.

Especially skidless tracing with the skidless probe BFW 250 and
the drive unit SD 26 enable the measurement and evaluation of not
only the roughness depth but also waviness and profile criteria.
The magnetic probe arm holder allows different probe arms to be
changed quickly and easily within seconds without the use of
tools.

The motorized height adjustment enables automatic zero
positioning and probe lifting.

The Bluetooth function, already known from MarSurf M 300, enables
cable-free operation with this unit as well.

Up to 250 measurements can be conducted with main-free operation
due to the built-in battery.

Features:

  • Profile determination: Primary, waviness and roughness
    profile
  • Probes: Inductive skidless tracing system with exchangeable
    probe inserts, 2 μm probe arms, measuring force approx. 0.7 mN
    (standard)
  • Standards DIN/ISO/JIS/ASME/MOTIF
  • Traversing lengths Lt as per DIN EN ISO / JIS:
    1.75 mm, 5.6 mm, 17.5 mm automatic, free entry
    (0.07 inc, 0.22 in, 0.7 in)
    as per MOTIF: 1 mm, 2 mm, 4 mm, 8 mm, 12 mm, 16 mm
  • Evaluation lengths lm (as per ISO/JIS) 1.25 mm, 4.0 mm, 12.5
    mm
  • Number n of sampling lengths (as per ISO/JIS):
    selectable
  • Automatic selection of filter and tracing length according to
    standards
  • Gaussian filter (as per DIN/JIS), Ls filter Standards
    DIN/ISO/JIS/ASME/MOTIF
  • Cutoff lc (as per ISO/JIS): 0.25 mm, 0.8 mm, 2.5 mm,
    automatic,
    (0.010 in, 0.032 in, 0.100 in)
  • Short cutoff (as per ISO/JIS) selectable
  • Measuring speed 0.2 mm/s; 1 mm/s
  • Profile resolution measuring range: ±250 μm = 8 nm,
    ±25 μm = 0.8 nm
  • 15 languages, 3 of them Asian
  • Parameters as per:
    DIN/ISO: Ra, Rq, Rz, Rmax, Rp, Rv, Rpk, Rk, Rvk,
    Mr1, Mr2, A1, A2, Vo, Rt, R3z, RPc, Rmr (3x), HSC, RSm, Rsk,
    Rdc, Rdq, Rkn,
    Pa, Pt, Pmr (3x), Pdc,
    Wa, Wq, Wt, WSm, Wsk,
    JIS: Ra, Rz, RzJIS94, Sm, S,
    ASME: RpA, Rpm
    MOTIF: R, Ar, Rx, W, Wx, Wte, CR, CL, CF,
    NR, NCRX, NW, CPM
  • Printing of R-profile (ISOASME//JIS), P-profile (MOTIF),
    material ratio curve, result record
  • Date and/or time of measurement
  • Integrated memory for results of up to approx. 40,000
    measurements and 30 profiles
  • Dynamic calibration function
  • Lock/code number protection for unit settings


PRODUCT APPLICATION

  • On shafts, housing components, large machines
  • In automotive engineering
  • On large workpieces
  • On milled and turned parts
  • On ground and honed workpieces
  • At the production site on the machine for fast testing of
    roughness depth, waviness and profile parameter of the workpiece
    in or on the machine
  • Can be expanded to a small measuring station in the workshop
    with the measuring stand

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